External users: registration to be carried out only through I-STEM portal
Additional information about sample and analysis details should be filled in the pdf form provided in the I-STEM portal under “DOWNLOAD CSRF”
Internal users (IITB): registration to be carried out only through DRONA portal
Additional information about sample and analysis details should be filled in the pdf form provided here.
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Category
- Microscopy and Imaging » Electron Microscopy
Booking Details
Facility Management Team and Location
office.saif@iitb.ac.in
0091-22- 2576 7691/2
naresh.ambati@iitb.ac.in
022-21596273
Facility Features, Working Principle and Specifications
Facility Description
The Focused Ion Beam Scanning Electron Microscope (FIB-SEM) , Helios 5 UC model combines the Scanning Electron Beam (SEM) and the Focused Ion Beam (FIB) in order to achieve analysis at nano-scale resolution. The instrument is equipped with different detectors, GIS systems and micromanipulator which make it ideal for to perform high-resolution imaging, nano-patterning, material deposition, milling, TEM lamella preparation etc.
Scanning Electron Microscope (SEM): Uses a focused electron beam to scan the sample surface, producing high-resolution images. Various detectors collect secondary electrons (providing topographical information), backscattered electrons (providing material contrast based on atomic number).
Focused Ion Beam (FIB): Typically uses a liquid metal (gallium, Ga+) ion source. The ion beam is used to ablate or "mill" material from the sample surface with nanometer precision. It can also be used for ion-induced imaging or for depositing materials using a gas injection system (GIS).
Electron Beam Column Specification:
Electron Source : Thermal Schottky Field-emitter.
Accelerating Voltage : Up to 30kV continuously variable.
Probe current : Continuously variable in the range of 0.8pA 100nA
Electron Beam Resolution : 0.6 nm @ 30 kV (STEM Mode)
0.7 nm @ 1 kV
0.6 nm @ 15 kV
FIB Column Specification:
Accelerating Voltage : Up to 30 kV, continuously variable
Ion Gun : Gallium liquid metal ion source available.
Probe current : It covers the range from 1 pA to 65 nA or larger.
Imaging Resolution : 2.5 nm @ 30 kV
Sample Preparation, User Instructions and Precautionary Measures
Sample preparation instructions :
· Sample dimensions should be less than 10 mm x 10 mm x 4 mm (height) in case of bulk samples for obtaining high resolution images.
· Medium for Dispersion Ethanol /Methanol / Water /Iso-propyl alcohol are available. Any other medium should be provided by the user. Dispersion will be done by ultrasonication.
· Kindly mark the edge of the sample to be observed for Cross section.
· Base of the sample should be flat for mounting on sample holder.
· Biological samples will be accepted only after user has done primarily fixation with suitable fixative.
· Samples should be in dry form. Hydrated samples must be dried properly before sending.
· Sample preparation if any should be done at user end (cutting the sample for CS, freeze fracturing, sample fixation for biological samples, stain ing of samples, oven drying should be done by the user)
· The samples should withstand high vacuum (~ 10 -5 Pa). Wet samples cannot be done.
· Samples for FIB related preparations should be well-polished / Uniform
· For any further query, kindly contact on Email: fibsem@iitb.ac.in, Contact: 022-2159-6861
Following sample details should be mentioned:
- Expected features (send a representative picture if available)
- Morphology & expected size
- Required Magnification (range)
- Nature of sample (conducting OR non-conducting)
- Solvent in which the powder samples are dispersion (Water, IPA, Ethanol, Acetone). Any other medium should be provided by the user. Dispersion will be done by ultrasonication.
- Potentially hazardous/toxic/radioactive samples may not be accepted for analysis.
- Your appointment will be scheduled as per the queue.
- The users will be informed about their date and time of slot by e-mail.
- The sample size should be less than 10 mm x 10 mm x 4 mm (height) and base of the sample should be flat for mounting on sample holder. Kindly mark the edge of the sample incase the sample has to be observed for Cross section. Wet samples cannot be done.
- We prefer that you or your representative, who knows/understands the sample/material should be present on the day of appointment.
- For any further query, kindly contact on Email: fibsem@iitb.ac.in, Contact: 022-2159-6861
Charges for Analytical Services in Different Categories
| Description | IIT Bombay Users | IIT Bombay – Monash Students | University / Academic Institutes | National Labs / SINE | IITB Research Park And MSME not associated with RP (appropriate certificate required) | Industry |
|
No GST | + 18% GST | + 18% GST | + 18% GST | + 18% GST | + 18% GST |
| |
SEM Imaging / EDS Analysis | 1800/- | 1800/- | 3600/- | 9000/- | 13500/- | 18000/- | Per Hour |
TEM Lamella preparation | 3000/- | 3000/- | 6000/- | 15000/- | 22500./- | 30000/- | Per Hour |
FIB Patterning | 3000/- | 3000/- | 6000/- | 15000/- | 22500./- | 30000/- | Per Hour |
FIB Slice & View | 3000/- | 3000/- | 6000/- | 15000/- | 22500./- | 30000/- |
Per Hour |
Applications
- Materials Science/Metallurgy
- Fractography
- Micro drilling and cutting tools
- Dental and medical
- Corrosion
- Polymer Science
- Energy Science/Engg.
- Biological and life sciences
- Semiconductors
- Civil and Earth Sciences
- Nanotechnology
- Ceramics
- Pharmaceuticals
Sample Details
NA
Sample type: Biological / Composite Material / Thin Film / Crystalline Solid / Metal/Polymer/Ceramic/Composite/ Other (Please specify): ......................
*biological samples should be submitted after primary fixation
Sample form : Powder/Pellet/Suspension/On glass substrate/Film
Sample dimensions : Should be less than 10 mm x 10 mm x 4 mm (height) in case of bulk samples
The base of the sample should be flat for mounting on sample holder.
NA
Sample dimensions : Should be less than 10 mm x 10 mm x 4 mm (height) in case of bulk samples
NA
Can be discussed before sample submission
NA