RTP
Make
Annealsys
Model
Annealsys AS-one 100
Facility Status
Working
Date of Installation
Facility Management Division
Centre for Sophisticated Instruments and Facilities (CSIF)-IoE Funded

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Category

  • Fabrication and Processing » Nanofabrication
  • Fabrication and Processing » Nanofabrication

Booking Details

Booking available for
Internal

Facility Management Team and Location

Facility In Charge
Prof. Swaroop Ganguly
Facility Manager
Dr. Deepti Rukade
Facility Operator
Mr. Pankaj, Mr. Nihal
Facility Management Members
Prof. Saurabh Lodha, Prof. Udayan G, Prof. Veeresh Deshpande
Department
Electrical Engineering
Lab Email ID
query.iitbnf@gmail.com
Facility Location
1.2 lab, First floor, IITBNF, EE Annex
Lab Phone No
022 2159 3552

Facility Features, Working Principle and Specifications

Facility Description

Facility Description

The rapid thermal processor has the capability to run the following processes (a) Rapid thermal annealing of compound semiconductors (b) Rapid Thermal Oxidation (RTO) (c) Rapid Thermal Nitridation (RTN)

Features Working Principle

Temperature range: RT to 900°C 

Max Ramp Rate 150°C/s (for Si) 40°C/s (for Susceptor)

Max. Safe Ramp Rate (for Si processing) - 100°C/s 

 Max. Safe Ramp Rate (for III-V processing using Graphite Susceptor) - 25°C/s 

 Vacuum range: Atmosphere approx to 1 mBar

Instructions for Registration, Sample Preparation, User Instructions and Precautionary Measures

Instructions for Registration

https://www.iitbnf.iitb.ac.in/iitbnf/operation/lab-access-procedure.php

Charges for Analytical Services in Different Categories

Usage Charges

In progress

Applications

RTA (Rapid Thermal Annealing RTO (Rapid Thermal Oxidation) Diffusion 

Compound semiconductor annealing Nitridation, Silicidation Crystallization and Densification

Sample Details

Allowed Substrate

Si

Gases allowed

Ar, N2, O2

Substrate Dimension

2 inch Si

Target dimension

NA

Contamination remarks

Na and K not allowed, metals not allowed

SOP, Lab Policies and Other Details

Publications