Power Device characterization system

External users: registration to be carried out only through I-STEM portal
Additional information about sample and analysis details should be filled in the pdf form provided in the I-STEM portal under “DOWNLOAD CSRF”

Internal users (IITB): registration to be carried out only through DRONA portal
Additional information about sample and analysis details should be filled in the pdf form provided here.

Make
Form-Factor
Model
B1505
Facility Status
Working
Date of Installation
Facility Management Division
Centre for Sophisticated Instruments and Facilities (CSIF)-IoE Funded

.

Category

  • Material Characterization » Electrical Characterisation

Booking Details

Available Equipment/ Mode of use
Working

Facility Management Team and Location

Facility In Charge
Prof. Saurabh Lodha
Facility Manager
Dr. Deepti Rukade
Facility Operator
Mr. Prabhat
Facility Management Members
Prof. Sandeep Anand, Prof. Dipankar Saha, Prof. Tanushree Choudhury
Department
Electrical Engineering
Lab Email ID
pdcs.nano@csif.iitb.ac.in
Facility Location
3rd Floor Characterization Lab
Lab Phone No
022 2159 3552

Facility Features, Working Principle and Specifications

Facility Description

Facility Description

The Power Device Characterization System (PDCS) enables on-wafer and discrete device testing, primarily under high-power conditions. 

Features Working Principle

It supports I–V and C–V measurements using dedicated force and sense probes, requiring four probes for two-terminal devices. The system features automated calibration modules, a display for convenient probing, a vacuum-based chuck for secure sample handling, and a shutter interlock for high-voltage safety. It also offers flexible configurations for two- and three-terminal devices, with gate bias capability provided through a fifth manipulator. The main limitations include the need for separate FORCE and SENSE probes, which increase setup complexity, and the requirement to keep the shutter closed above 42 V in reverse bias due to interlock protection.

Body Specification

NA

Sample Preparation, User Instructions and Precautionary Measures

Instruction for Sample Preparation

NA

User Instructions and Precautionary Measures

Si/ Ge/ Metal and Materials that don't vaporize at Room Temp.

Charges for Analytical Services in Different Categories

Usage Charges
  • Internal- Rs. 1600/hr
  • External Academia - Rs. 2400/-
  • Startup - Rs. 3000/-
  • R&D - Rs.3600/-
  • Industry - Rs.5800/-

Applications

For electrical measurements of devices

Sample Details

Chemical allowed

NA

Allowed Substrate

Si/ Ge/ Metal and Materials that don't vaporize at Room Temp.

Gases allowed

NA

Substrate Dimension

Atleast >Probe diameter (2,5,7 um)

Target dimension

NA

Contamination remarks

Samples with Na and K and Outside samples are not allowed

Precursors/ Targets allowed

NA

SOP, Lab Policies and Other Details

Training and Other Policy Documents

Publications