Field Emission Gun-Scanning Electron Microscopes (FEG-SEM)
Field Emission Gun-Scanning Electron Microscopes (FEG-SEM)
Model
JSM-7600F
Facility Status
Working
Date of Installation
Facility Management Division
Sophisticated Analytical Instrument Facility (SAIF)

Category

  • Microscopy and Imaging » Electron Microscopy

Booking Details

Booking available for
Internal and External Both
Available Mode for Use
Imaging
EDS- Area/Line/Mapping

Facility Management Team and Location

Faculty In Charge
Prof. Suparna Mukherji
head.saif@iitb.ac.in
office.saif@iitb.ac.in
0091-22- 2576 7691/2
Facility Manager
Mr. Naresh Ambati
naresh.ambati@iitb.ac.in
Facility Operator
Ms. Mayura Chaubal<br>mayurasule@iitb.ac.in,
Co-convenors
Mr. Naresh Ambati
naresh.ambati@iitb.ac.in
Department
CRNTS
LAB Email ID
fegsemlab@iitb.ac.in
Facility Location
Room No. 315B, Ground Floor, SAIF
Lab Phone No
022-21596863

Facility Features, Working Principle and Specifications

Features Working Principle

The Jeol field emission scanning electron microscope is a versatile high resolution scanning electron microscope. This Machine combines two proven technologies – an electron column with semi-in-lens objective lens which can provide high resolution imaging by low accelerating voltage and Schottky FEG with strong electrostatic field to induce electron emission. An FEG emitter gives a more coherent beam and its brightness is much higher than the tungsten filament. The instrument is also specialised with Gentle Beam (GB) mode applies a negative voltage to a specimen and decelerates incident electrons just before they irradiate the specimen, thus the resolution is improved at an extremely low accelerating voltage. Thus, this method is suitable for observation of fine structures, especially on low-density materials, non-conductive materials at high magnification with effective detection of low angle backscattered electrons.
 

  • Source: Field emission gun
  • SEI Resolution: 1.0nm at 15 kv
                             1.5nm at 1 kv, in GB mode
  • Magnification: Low: 25X to 10,000X
                           High: 100X to 1,000,000X at 4x5 photo size
  • Accerating Voltage: 0.1 to 30 kv
  • Probe Current Range: 1 pA to ≥ 200 nA

Instructions for Registration, Sample Preparation, User Instructions, Precautionary Measures and Charges

Instruction for Sample Preparation

Sample preparation instructions :

  • Medium for Dispersion Ethanol /Methanol / Water /Iso-propyl alcohol. Any other medium should be provided by the user.
  • Dispersion will be done by ultrasonication.
  • Kindly mark the edge of the sample to be observed for Cross section.
  • Base of the sample should be flat for mounting on sample holder.
  • Biological samples will be accepted only after user has done primarily fixation with suitable fixative.
  • Sample preparation if any should be done at user end (cutting the sample for CS, freeze fracturing, sample fixation for biological samples, staining of samples, oven drying should be done by the user)
  • Samples should be in dry form. Hydrated samples must be dried properly before sending.
  • The samples should withstand high vacuum (~ 10 -5 Pa). Wet samples cannot be done.
  • The bulk sample size should be less than 12.5 mm x 12.5 mm x 10 mm (height) 
  • For any further query, kindly contact on Email: fegsemlab@iitb.ac.in, Contact: 022 2159 6863
User Instructions and Precautionary Measures

Instructions   

1. A requisition letter addressed to Head, SAIF along with a printout of electronic fund transfer (NEFT) proof should be sent by post or
     submitted in person to SAIF office, IIT Bombay, Powai, Mumbai-400076.

2. If you are not supposed to be present during the measurements, please mention as many details as possible, such as:
      a. Expected features you are looking for (send a representative picture if available).
      b. Images up to what magnification factor you want.
      c. Nature of your sample, for example, whether it is conducting or non-conducting.
      d. If it needs to be dispersed in any solvent (for powdered samples).
If required, please attach a separate sheet.

3. Once we receive the requisition letter and advance payment, you will receive a tentative date of appointment.

4. The user will be informed about their date and time of slot by e-mail.

5. The sample should be dry and should withstand high vacuum ( ~ 10 -5 Pa). Wet biological sample can’t be done in FEG-SEM

6. The sample size should be less than 12.5 mm x 12.5 mm x 10 mm (height) and the side opposite the side of interest, should be flat (to enable sample mounting). The smaller the sample height the better.

7. The user is welcome to be present in the laboratory during analysis.

8. Before proceeding further, please review How to Use Facility and Payment Procedure for more information.

FEG-SEM Charges without GST:

 Academic 
(In Rs.)
National Lab 
(In Rs.)
Industry 
(In Rs.)
IIT Bombay 
(In Rs.)
Unit
 SEM Image (Surface OR Cross Section)  1240/-  3100/-  6200/- 620/- Per Sample
 SEM Image (Surface + Cross Section)  1770/-  4425/-  8850/-  885/- Per Sample
 EDS  350/-  875/-  1750/-  175/- Per EDS analysis
 EDS Mapping  700/-  1750/-  3500/-  350/- Per EDS map
 WDS  700/-  1750/-  3500/-  350/- Per WDS analysis
 WDS Mapping(For 3 element maps)  1420/-  3550/-  7100/-  710/- (For 3 element maps)
 WDS Mapping(Above 3 elements maps)  1900/-  4750/-  9500/-  950/- (Above 3 elements maps)

Applications

  • Materials Science/Metallurgy
  • Fractography
  • Micro drilling and cutting tools 
  • Dental and medical 
  • Corrosion  
  • Polymer Science 
  • Energy Science/Engg. 
  • Biological and life sciences 
  • Semiconductors
  • Civil and Earth Sciences
  • Nanotechnology
  • Ceramics
  • Pharmaceuticals

Sample Details

Chemical allowed

Sample type: Biological / Composite Material / Thin Film / Crystalline Solid / Metal/Polymer/Ceramic/Composite/Rock/Cement

Sample form: Powder/Pellet/Suspension/Film/Sample on silicon wafer

Substrate Dimension

The bulk sample size should be less than 12.5 mm x 12.5 mm x 10 mm (height) and the side opposite the side of interest, should be flat (to enable sample mounting). The smaller the sample height the better. 

SOP, Lab Policies and Other Details

Publications

Publications
NA