Category
- Microscopy and Imaging » Electron Microscopy
Booking Details
- TEM Lamella preparation
- Site specific cross sectional imaging, 3D Slice and View
- Precision machining for micro tools
Facility Management Team and Location
head.saif@iitb.ac.in
0091-22- 2576 7691/2
naresh.ambati@iitb.ac.in
naresh.ambati@iitb.ac.in
Facility Features, Working Principle and Specifications
The Helios 5 UC model combines the Scanning Electron Beam (SEM) and the Focused Ion Beam (FIB) in order to achieve analysis at nano-scale resolution. The instrument is equipped with different detectors, GIS systems and micromanipulator which make it ideal for to perform high-resolution imaging, nano-patterning, material deposition, milling, TEM lamella preparation etc.
Electron Beam Column Specification:
Electron Source : Thermal Schottky Field-emitter.
Accelerating Voltage : Up to 30kV continuously variable.
Probe current : Continuously variable in the range of 0.8pA 100nA
Electron Beam Resolution : 0.6 nm @ 30 kV (STEM Mode)
0.7 nm @ 1 kV
0.6 nm @ 15 kV
FIB Column Specification:
Accelerating Voltage : Up to 30 kV, continuously variable
Ion Gun : Gallium liquid metal ion source available.
Probe current : It covers the range from 1 pA to 65 nA or larger.
Imaging Resolution : 2.5 nm @ 30 kV
Instructions for Registration, Sample Preparation, User Instructions, Precautionary Measures and Charges
New users are requested to contact FIB-SEM lab before registration (Phone No. : 022-21596861; Email Id : fibsem@iitb.ac.in ) and also provide the details pertaining to your required sample analysis.
- Users would need to do online registration for their sample analysis. Before proceeding further, please review link for How to Use Facility (http://www.saif.iitb.ac.in/how%20to%20use%20facility.html ) and Payment Procedure (http://www.saif.iitb.ac.in/charges.html )for more information. You may decide the charges to be paid after mutually understanding the requirements pertaining to the mode of analysis.
- After the online registration is completed, the appointment will be scheduled as per the queue.
- The users will be informed about their date and time of slot by e-mail.
- We prefer that the user/ representative person, who knows / understands the sample / material, should be present on the day of appointment.
- Potentially hazardous/toxic/radioactive samples may not be accepted for analysis.
- After registration, samples can be send by post or submitted in person to SAIF/CRNTS office, IIT Bombay, Powai, Mumbai-400076.
- If an appointment is to be cancelled/postponed, the users are requested to inform the FIB-SEM lab atleast 24 hours prior to the appointment date
Sample preparation instructions :
· Sample dimensions should be less than 10 mm x 10 mm x 4 mm (height) in case of bulk samples for obtaining high resolution images.
· Medium for Dispersion Ethanol /Methanol / Water /Iso-propyl alcohol are available. Any other medium should be provided by the user. Dispersion will be done by ultrasonication.
· Kindly mark the edge of the sample to be observed for Cross section.
· Base of the sample should be flat for mounting on sample holder.
· Biological samples will be accepted only after user has done primarily fixation with suitable fixative.
· Samples should be in dry form. Hydrated samples must be dried properly before sending.
· Sample preparation if any should be done at user end (cutting the sample for CS, freeze fracturing, sample fixation for biological samples, stain ing of samples, oven drying should be done by the user)
· The samples should withstand high vacuum (~ 10 -5 Pa). Wet samples cannot be done.
· Samples for FIB related preparations should be well-polished / Uniform
· For any further query, kindly contact on Email: fibsem@iitb.ac.in, Contact: 022-2159-6861
Following sample details should be mentioned:
- Expected features (send a representative picture if available)
- Morphology & expected size
- Required Magnification (range)
- Nature of sample (conducting OR non-conducting)
- Solvent in which the powder samples are dispersion (Water, IPA, Ethanol, Acetone). Any other medium should be provided by the user. Dispersion will be done by ultrasonication.
- Potentially hazardous/toxic/radioactive samples may not be accepted for analysis.
- Your appointment will be scheduled as per the queue.
- The users will be informed about their date and time of slot by e-mail.
- The sample size should be less than 10 mm x 10 mm x 4 mm (height) and base of the sample should be flat for mounting on sample holder. Kindly mark the edge of the sample incase the sample has to be observed for Cross section. Wet samples cannot be done.
- We prefer that you or your representative, who knows/understands the sample/material should be present on the day of appointment.
- Before proceeding further, please review link for How to Use Facility (http://www.saif.iitb.ac.in/how%20to%20use%20facility.html ) and Payment Procedure (http://www.saif.iitb.ac.in/charges.html )for more information. You may decide the charges to be paid after mutually understanding the requirements pertaining to the mode of analysis.
- For any further query, kindly contact on Email: fibsem@iitb.ac.in, Contact: 022-2159-6861
FIB Charges (Excluding GST) ***This is an introductory price. The charges may be reviewed at 6 months.
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Applications
- Materials Science/Metallurgy
- Fractography
- Micro drilling and cutting tools
- Dental and medical
- Corrosion
- Polymer Science
- Energy Science/Engg.
- Biological and life sciences
- Semiconductors
- Civil and Earth Sciences
- Nanotechnology
- Ceramics
- Pharmaceuticals
Sample Details
Sample type: Biological / Composite Material / Thin Film / Crystalline Solid / Metal/Polymer/Ceramic/Composite/ Other (Please specify): ......................
*biological samples should be submitted after primary fixation
Sample form : Powder/Pellet/Suspension/On glass substrate/Film
Sample dimensions : Should be less than 10 mm x 10 mm x 4 mm (height) in case of bulk samples
The base of the sample should be flat for mounting on sample holder.