External users: registration to be carried out only through I-STEM portal
Additional information about sample and analysis details should be filled in the pdf form provided in the I-STEM portal under “DOWNLOAD CSRF”
Internal users (IITB): registration to be carried out only through DRONA portal
Additional information about sample and analysis details should be filled in the pdf form provided here.
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Category
- Microscopy and Imaging » Electron Microscopy
Booking Details
Facility Management Team and Location
Facility Features, Working Principle and Specifications
Facility Description
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Zeiss Sigma 500 Scanning Electron Microscope (SEM) is a high-performance technique designed for advanced imaging and analytical applications. It features a field emission gun (FEG) for high-resolution imaging, capable of achieving nanometer-scale detail. The Sigma 500 offers a user-friendly interface, fast image acquisition, and superior signal-to-noise ratio. Without the Electron Back scatter Diffraction (EBSD) detector, the instrument focuses on secondary and back scattered electron imaging, along with energy-dispersive X-ray spectroscopy (EDS) for elemental analysis, making it ideal for material characterization and failure analysis. Its modular design allows future upgrades for additional analytical capabilities.
Main features:
• Schottky type field emitter system
• Resolution: 0.8nm at 15 kV; 1.6 nm at 1 kV
• Accelerating voltage: 0.02 to 30 kV
• Beam current configurations: 100nA .
• Electromagnetic beam alignment
• Work distance 0 – 50 mm
• Magnification Range: 10 – 10,00,000x
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Sample Preparation, User Instructions and Precautionary Measures
Sample type that can be analyzed: Composite Material / Thin Film / Crystalline Solid / Metal/Polymer.
Sample form that can be analyzed: Powder/Pellet/Film/Sample on silicon wafer
- Kindly mark the edge of the sample to be observed for Cross section.
- Base of the sample should be flat for mounting on sample holder.
- Biological samples will be accepted only after user has done primarily fixation with suitable fixative.
- Sample preparation if any should be done at user end (cutting the sample for CS, freeze fracturing, oven drying should be done by the user)
- Cross-section analysis of powdered samples cannot be performed.
- Samples should be in dry form. Hydrated samples must be dried properly before sending.
- The samples should withstand high vacuum (~ 10 -5 Pa). Wet samples cannot be done.
- The bulk sample size should be less than 12.5 mm x 12.5 mm x 10 mm (height)
- For any further query, kindly contact on Email: fegsem@chem.iitb.ac.in.
Charges for Analytical Services in Different Categories
Applications
1.Surface morphology
2. Particle size & shape
3. Nanomaterials
4. Elemental analysis – EDS
5. Elemental mapping
6. Polymers
7. Metals & alloys
8. Ceramics & glass
9. Thin films & coatings
10. Catalysts & Battery materials,etc.
Sample Details
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SOP, Lab Policies and Other Details
Publications
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