White Light Interferometer
Request form for external booking (Sample and analysis details)
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Make
Bruker Contour
Facility Status
Working
Facility Management Division
Centre for Sophisticated Instruments and Facilities (CSIF)

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Category

  • Microscopy and Imaging » Confocal Microscopy

Booking Details

Booking available for
Internal and External Both

Facility Management Team and Location

Facility In Charge
Ramesh Singh
Co-convenors
Soham Mujumdar
Facility Manager
Arun Nair
Facility Operator
Arun Nair
Facility Management Members
Prof Ramesh Singh
Prof Soham Mujumdar
Prof Rakesh Mote
Prof Indradev Samajdar
Department
Mechanical
Lab Email ID
mtl.iitb@gmail.com
Facility Location
MTL lab, S3 bay
Lab Phone No
3749

Facility Features, Working Principle and Specifications

Facility Description

Facility Description

Bruker Contour X200
Accurate surface topography
Sub-nanometer vertical resolution
2D & 3D non contact surface Metrology

Features Working Principle

White light interferometry is a high-resolution, non-contact technique used to measure surface profiles by analyzing the interference patterns produced when white light interacts with a sample surface. A broad spectrum of light is split into two beams, one reflected from the surface and the other from a reference mirror. The interference between these beams depends on the optical path difference, which is influenced by the height variations of the surface. Due to the short coherence length of white light, clear interference fringes only appear for small height differences, allowing precise measurements of surface features. This technique is widely used for 3D surface profiling, step height measurements, and surface roughness analysis.

Body Specification

Max. Scan Range ≤10 mm 

Vertical Resolution <0.01 nm 

Lateral Resolution 0.38 μm min (Sparrow criterion); 0.13 μm (with AcuityXR®) 

Step Height Accuracy <0.75% 

Step Height Repeatability <0.1% 1 sigma repeatability 

Max Scan 37 μm/sec (with standard camera) 

Reflectivity Range 0.05% to 100% 

Max. Sample Slope ≤40° (shiny surfaces); ≤87° (rough surfaces) 

Sample Height ≤100 mm (4 in.) 

XY Sample Stage 150 mm (6 in.) automation stage 

Z Focusing Automated 

Tip/Tilt Function ±6° available on stage 

Optical Metrology Module Patented dual-color LED illumination; Single-objective adapter; Optional automated or manual turret; Optional motorized or manual discrete modules 

Objectives Parfocal: 2.5X, 5X, 10X, 20X, 50X, 115X; LWD: 1X, 1.5X, 2X, 5X,10X; TTM: 2X, 5X, 10X, 20X; Bright Field: 2.5X, w5X, 10X, 50X 

Available Zoom Lenses 0.55, 0.75X, 1X 1.5X, 2X 

Camera Monochrome (standard) or color (optional); 5 MP with 1200x1000 data array 

Instructions for Registration, Sample Preparation, User Instructions and Precautionary Measures

Instruction for Sample Preparation

Samples not allowed - Fluid, Transparent and Highly reflective.

Fixture - Need to get one's own fixture if you have an intricate sample.

Step Height - Step height if any must be less than 2mm. Avoid 90 -degree step height.

Sample Size - Max (150mm x 150mm x 100mm)

Sample Weight - less than 500g

Charges for Analytical Services in Different Categories

Usage Charges

Facility Name

Internal (IITB)

External (Academic)*

Industry/Others*

 

White Light Interferometry

 

 

Rs. 500/scan

 

Rs. 1000/scan

 

Rs. 2000/scan

Applications

Precision Engineering

MEMS and Sensors

Orthopedics/Ophthalmics

Tribology

Semiconductors

Optics

Sample Details

SOP, Lab Policies and Other Details

Publications