Transmission Electron Microscopy Facility (300 kV)
Transmission Electron Microscopy Facility (300 kV)@MEMS
Make
Thermo Scientific
Model
Themis 300 G3
Facility Status
Working
Date of Installation
Facility Management Division
Institute Central Research Facilities (ICRF)

Category

  • Microscopy and Imaging » Electron Microscopy

Booking Details

Booking available for
Internal

Facility Management Team and Location

Faculty In Charge
Prof.I Samajdar
indra@iitb.ac.in +91-22-2576-7621
Facility Manager
Mr. Prakash Ishte, prakash007@iitb.ac.in,022-21596765
Facility Operator
Mrs Parul Thakur,30005125@iitb.ac.in,022-21596765
Co-convenors
Prof. I Samajdar Prof. Nagamani J. Balila Prof. Ashutosh Gandhi Prof. MJNV Prasad Prof. K G Suresh Prof. Sushil Mishra Prof. P J. Guruprasad Prof. Sankara Sarma V. Tatiparti
Department
MEMS
LAB Email ID
temcoest@iitb.ac.in
Facility Location
Room No. 027, Ground Floor, Department of Metallurgical Engineering & Material Science, IIT Bombay, Powai, Mumbai – 400076
Lab Phone No
022-2159-6765 , +917506110754 (Mr Prakash Ishte)

Facility Features, Working Principle and Specifications

Features Working Principle

Specifications

  • Point resolution – 0.2 nm for TEM, 0.12 nm for STEM
  • Information limit – 0.18 nm
  • Minimum Brightness – 9.88 x 107 A/m2srV
  • EDS energy resolution at Mn – 125 eV
  • Maximum spot drift – 0.45 nm/min

Instructions for Registration, Sample Preparation, User Instructions, Precautionary Measures and Charges

Instructions for Registration

Register Through Drona, data will be provided in CD after completion of slot

Instruction for Sample Preparation

Powder sample should be sonicated properly and should not agglomerate

User Instructions and Precautionary Measures

Sample Preparation Guidelines

  • Sample preparation is to be done by the user.
  • Powder sample should be dry and should not be beam sensitive.
  • Bulk sample should be a circular 3 mm diameter disk.

Applications

Deformation in Metals: Deformation in metals involves changes in the shape or size of a metal object due to the application of an external force. It can occur through various mechanisms such as slip, twinning, or grain boundary movement.
Nano Science/Nano Technology: Nano science and nanotechnology deal with the study and application of extremely small things, typically on the scale of nanometers. This field encompasses various disciplines such as chemistry, biology, physics, and engineering.
Thin Films: Thin films are layers of material ranging from fractions of a nanometer to several micrometers in thickness. They are used in various applications including electronics, optics, and coatings.
Energy Science/Engineering: Energy science and engineering focus on the development of technologies for energy production, conversion, and storage. This includes renewable energy sources, batteries, fuel cells, and energy-efficient systems.
Chemical Composition and Quantification (TEM): Transmission Electron Microscopy (TEM) is used to determine the chemical composition and quantify elements in materials at the atomic level. It provides high-resolution imaging and analytical capabilities.
Elemental Mapping (STEM): Scanning Transmission Electron Microscopy (STEM) is used for elemental mapping to visualize the distribution of elements within a sample. This technique combines imaging with spectroscopy for detailed analysis.
Orientation Mapping (A-Star): Orientation mapping using the A-Star technique involves determining the crystallographic orientation of grains in a material. This is done using advanced electron diffraction methods such as 4D-STEM, which provides high precision and resolution.

Sample Details

Substrate Dimension

Sample Preparation Guidelines

  • 3 mm diameter copper grid
  • 3 mm diameter bulk sample (Metal/Ceramic)
  • FIB Lamella

SOP, Lab Policies and Other Details

Publications

Publications
Publications