Transmission Electron Microscopy Facility (300 kV)@MEMS
Request form for external booking (Sample and analysis details)
Make
Thermo Scientific
Model
Themis 300 G3
Facility Status
Working
Date of Installation
Facility Management Division
Centre for Sophisticated Instruments and Facilities (CSIF)

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Category

  • Microscopy and Imaging » Electron Microscopy

Booking Details

Booking available for
Internal and External Both

Facility Management Team and Location

Facility In Charge
Prof.I Samajdar
indra@iitb.ac.in +91-22-2576-7621
Facility Manager
Mr. Prakash Ishte, prakash007@iitb.ac.in,022-21596765
Facility Operator
Mrs Parul Thakur,30005125@iitb.ac.in,022-21596765
Facility Management Members
Prof. I Samajdar
Prof. Nagamani J. Balila
Prof. Ashutosh Gandhi
Prof. MJNV Prasad
Prof. K G Suresh
Prof. Sushil Mishra
Prof. P J. Guruprasad
Prof. Sankara Sarma V. Tatiparti
Department
MEMS
Lab Email ID
temcoest@iitb.ac.in
Facility Location
Room No. 027, Ground Floor, Department of Metallurgical Engineering & Material Science, IIT Bombay, Powai, Mumbai – 400076
Lab Phone No
022-2159-6765 , +917506110754 (Mr Prakash Ishte)

Facility Features, Working Principle and Specifications

Facility Description

Facility Description

The transmission electron microscope is a 300kV high-resolution microscope with a field emission gun and excellent analytical performance. This facility is used for analysis of elemental composition by energy dispersive spectroscopy, diffraction for crystal structure determination and crystallographic studies.

Features Working Principle

Specifications

  • Point resolution – 0.2 nm for TEM, 0.12 nm for STEM
  • Information limit – 0.18 nm
  • Minimum Brightness – 9.88 x 107 A/m2srV
  • EDS energy resolution at Mn – 125 eV
  • Maximum spot drift – 0.45 nm/min

Instructions for Registration, Sample Preparation, User Instructions and Precautionary Measures

Instructions for Registration

Register Through Drona, data will be provided in CD after completion of slot

Instruction for Sample Preparation

Powder sample should be sonicated properly and should not agglomerate

User Instructions and Precautionary Measures

Sample Preparation Guidelines

  • Sample preparation is to be done by the user.
  • Powder sample should be dry and should not be beam sensitive.
  • Bulk sample should be a circular 3 mm diameter disk.

Charges for Analytical Services in Different Categories

Usage Charges
User Type Charges per hour
IIT Bombay TAs on Specific Instruments200
IIT Bombay Internal Users1000
Other Academic Institute2000+ 18 % GST
National Labs4000 +18% GST
Industry/Non-Government Entity8000 + 18% GST
Start-up (SINE incubation)5000 + 18% GST
Monash IIT Bombay1000 + 18% GST
SAARCS Countries & African Counties(low-Income Countries)

Academic ₹ 5000 + 18% GST

 Industry ₹ 10000 + 18% GST

For Other Countries

Academic ₹ 10000 + 18% GST 

Industry ₹ 20000 + 18% GST

Cu Grid / Lacey Grid₹ 500/- (per grid)

Applications

Deformation in Metals: Deformation in metals involves changes in the shape or size of a metal object due to the application of an external force. It can occur through various mechanisms such as slip, twinning, or grain boundary movement.
Nano Science/Nano Technology: Nano science and nanotechnology deal with the study and application of extremely small things, typically on the scale of nanometers. This field encompasses various disciplines such as chemistry, biology, physics, and engineering.
Thin Films: Thin films are layers of material ranging from fractions of a nanometer to several micrometers in thickness. They are used in various applications including electronics, optics, and coatings.
Energy Science/Engineering: Energy science and engineering focus on the development of technologies for energy production, conversion, and storage. This includes renewable energy sources, batteries, fuel cells, and energy-efficient systems.
Chemical Composition and Quantification (TEM): Transmission Electron Microscopy (TEM) is used to determine the chemical composition and quantify elements in materials at the atomic level. It provides high-resolution imaging and analytical capabilities.
Elemental Mapping (STEM): Scanning Transmission Electron Microscopy (STEM) is used for elemental mapping to visualize the distribution of elements within a sample. This technique combines imaging with spectroscopy for detailed analysis.
Orientation Mapping (A-Star): Orientation mapping using the A-Star technique involves determining the crystallographic orientation of grains in a material. This is done using advanced electron diffraction methods such as 4D-STEM, which provides high precision and resolution.

Sample Details

Substrate Dimension

Sample Preparation Guidelines

  • 3 mm diameter copper grid
  • 3 mm diameter bulk sample (Metal/Ceramic)
  • FIB Lamella

SOP, Lab Policies and Other Details

Publications

Research References

  1. R. Tripathi et al. ACS Appl. Nano Mater. 2022, 5, 12, 17767–17782
  2. P. Gandharapu et al. Clean Technologies and Environmental Policy. 2023
  3. Vaibhav Verma et al. Carbon, Volume 209, 5 June 2023, 118007
  4. B.S Kumar et al. Adv. Energy Mater. 2023, 2204407
  5. Anagha Pradeep et al. Carbon Volume 201, 5 January 2023, Pages 1-11
  6. I Biswas et al. Chem. Commun., 2023, 59, 4332-4335
  7. B S Kumar et al. Chem. Mater. 2022, 34, 23, 10470–10483
  8. Kankona Singha Roy et al., ACS Appl. Mater. Interfaces, 13(8) (2021) 9897-9907
  9. Anagha Pradeep et al., Elec. Acta, 362 (2020) 137122
  10. P. Manikandan et al., MMTA, (2021) https://doi.org/10.1007/s11661-021-06337-y
  11. Agrawal et al., MMTA, 52 (2021) 1465-1476
  12. Saurabh Kumar et al. Mater. Charac., 2023, 199, 112822
  13. Aditya Prakash et al., IJP, 2023
  14. Saurabh Kumar et al., MMTA, 2023, 54A, 1236-1251
  15. Soudip Basu et al., Mater. Charac., 2023, 197, 112704
  16. Sanjay Manda et al., MMTA, 2023, 54A, 562-576
  17. A. Sarkar et al., Mater. Charac., 2023, 194, 112426, 1-15