Category
- Microscopy and Imaging » Electron Microscopy
Booking Details
Facility Management Team and Location
Facility Features, Working Principle and Specifications
AFM Modes and Accessories
Routine Modes
- Contact mode AFM
- Tapping mode AFM
Advanced Modes
- STM with following applications:
- Low current STM
- Scanning Tunneling Spectroscopy (STS)
- Fluid Cell AFM
- Magnetic Force Microscopy (MFM)
- Electric Force Microscopy (EFM)
- Conductive AFM (C-AFM)
- Electrochemical AFM and STM
- Nanoindentation and Nanoscratching
* Subject to availability of manpower with relevant expertise.
Available Scanners
- J scanner (125 × 125 × 5 µm)
- E scanner (10 × 10 × 5 µm)
- A scanner (0.4 × 0.4 × 5 µm)
Other Accessories
- Vibration isolation table and acoustic isolation hood
- Optical microscope with color digital video for area selection
- Digital image processing and analysis software
- Quadrexed phase signal processing for higher phase sensitivity and fast scan micro actuator cantilevers
Instructions for Registration, Sample Preparation, User Instructions, Precautionary Measures and Charges
We shall accept online registration only through the IRCC webpage. If you need to cancel your slot, send an email immediately to with an explanation.
- Slots will be provided on a first-come-first-served basis.
- USB drives are strictly prohibited for copying data to minimize virus-related issues. You are requested to bring a new blank CD to transfer your data. All data must be transferred within 7 days of imaging. Without exception.
- Users must be present during the entire slot.
Applications
AFM Techniques and Applications
Surface Topography and Roughness
Surface topography and roughness characterization involves measuring the texture and irregularities of a surface. Atomic Force Microscopy (AFM) is commonly used for this purpose, providing high-resolution images that reveal surface features at the nanoscale. This analysis is crucial for understanding material properties and behavior in various applications.
Particle Size Analysis
Particle size analysis using AFM helps determine the dimensions and distribution of particles at the nanometer scale. This is important for materials science and engineering, where particle size can significantly influence the properties and performance of materials.
Atomic Resolution Imaging
AFM allows for atomic resolution imaging, enabling the visualization of individual atoms on a surface. This capability is essential for research in nanotechnology and materials science, providing detailed insights into atomic-scale structures and phenomena.
Electrical Mapping
Electrical mapping with AFM involves measuring the electrical properties of a sample surface, such as conductivity and potential distribution. Techniques like Conductive AFM (C-AFM) and Electrostatic Force Microscopy (EFM) are used for this purpose, helping to analyze and optimize electronic materials and devices.
Magnetic Mapping
Magnetic Force Microscopy (MFM) is an AFM technique used to map magnetic properties at the nanoscale. This method is valuable for studying magnetic materials and devices, providing insights into magnetic domain structures and behaviors.
Mechanical Properties
AFM can measure mechanical properties such as hardness, elasticity, and stiffness by probing the sample with a sharp tip. Techniques like nanoindentation and Force Modulation Microscopy (FMM) provide quantitative data on material mechanical behavior.