• Imaging/Mapping:

XYZ mapping:

XY stage :X=75 mm and Y=50 mm , 1 µm repeatability

Step-by-step mode: step size (min) 50 nm

Z stage min step = 0.1 µm 

Duoscan Mode with scanning mirror.

Scanning/Averaging followed by Macro mapping for large area mapping

• Polarization dependent Raman Scattering :Range 400 – 700 nm
• Low Temp : Min 80K

Raman scattering is an inelastic scattering of incident light from vibrating atoms or molecules or from electronic states like plasmons, coupled plasmon-phonon states etc with change in the wavelength. It consists of Stokes and anti-Stokes components depending on whether the scattered wavelength is greater or less than the incident one. Thus Raman spectrum from a sample consists of several lines characteristic of the unique vibrational modes of the sample and has turned out to a fast and reliable non-destructive technique for characterization, material property studies under different sample environment.  However the Raman scattering efficiency is very poor and ≈ 10-3 – 10-5 times the elastically scattered Rayleigh component and requires a powerful excitation source. The excitation sources are generally UV/VIS/NIR CW laser sources with high incident photon flux and detection is by highly efficient CCDs. The change in the wavelength of the scattered radiation is analyzed using a single/multiple grating high resolution UV-visible-NIR optical spectrometer/spectrograph. The spectrometer should possess a very high rejection capability of the elastically scattered Rayleigh component from much weaker Raman scattered light. This is usually achieved by two or three stage spectrometers or more recently by single stage spectrometers with highly efficient Holographic Notch filters or sharp cutoff dielectric edge filters.