Stylus Profilometer

External users: registration to be carried out only through I-STEM portal
Additional information about sample and analysis details should be filled in the pdf form provided in the I-STEM portal under “DOWNLOAD CSRF”

Internal users (IITB): registration to be carried out only through DRONA portal
Additional information about sample and analysis details should be filled in the pdf form provided here.

Make
Bruker
Model
DektakXT
Facility Status
Working
Date of Installation
Facility Management Division
Sophisticated Analytical Instrument Facility (SAIF)

.

Category

  • Material Characterization » Mechanical Characterisation

Booking Details

Booking available for
Internal and External Both
Available Equipment/ Mode of use
  • Scan Type     : Standard Scan, Static Tower scan, Static scan, Map Scan 3D
  • Range (vertical)  : 6.5 um,65.5 um,524 um,1 mm
  • Profile            : Hills &Valley
  • Stylus Force:  1 mg - 15 mg  
  • Scan length: scan length between 50 to 55 mm

Facility Management Team and Location

Facility In Charge
Head, CSIF
office.saif@iitb.ac.in
0091-22- 2576 7691/2
Facility Manager
Mr. Naresh Ambati, naresh.ambati@iitb.ac.in
Facility Operator
Mr. Nilesh Marle, nileshmarle@iitb.ac.in
Department
Sophisticated Analytical Instrument Facility (SAIF)
Lab Email ID
nileshmarle@iitb.ac.in
Facility Location
Room No. 413A, First Floor, SAIF
Lab Phone No
022-2159 6885/72

Facility Features, Working Principle and Specifications

Facility Description

Facility Description
  • The DektakXT stylus surface profiler is an advanced thin and thick film step height measurement tool.
     Profiling surface topography and waviness.
  •  In addition to taking two-dimensional surface profile measurements, the DektakXT system can produce three-dimensional measurements (3D Mapping) also.
  •  Stress Measurement for calculating tensile or comprehensive stress on processed wafers.
Features Working Principle

Stylus profilometers use a probe to detect the surface, physically moving a probe along the surface in order to acquire the surface height. This is done mechanically with a feedback loop that monitors the force from the sample pushing up against the probe as it scans along the surface.

 A feedback system is used to keep the arm with a specific amount of torque on it,

 known as the ‘setpoint’. The changes in the Z position of the arm holder can then be used to reconstruct the surface. The DektakXT system takes measurements electromechanically by moving a diamond –tipped stylus over the sample surface according to user-programmed scan length, speed and stylus force.

 Because a stylus profilometer involves physical movements in X, Y, and Z while maintaining contact with the surface, it is slower than non-contact techniques. The stylus tip size and shape can influence the measurements and limit the lateral resolution.

Sample Preparation, User Instructions and Precautionary Measures

Instruction for Sample Preparation
  • Substrate Dimension: Provide solid samples Min- 1 cm x 1 cm, Maximum 10 cm x 10 cm (size either in the form square/ rectangular/circular).
  • Kindly mark the sample side for the analysis.
  • Base of the sample should be flat for mounting on sample holder.
  • Samples should be in dry form. Sample preparation if any should be done at user end (cutting the sample).
  • Chemical Allowed: No wet chemicals allowed. No sticky and soft sample allowed.

MSDS (Material Safety Data Sheet) should be given along with samples to ensure that samples should not be toxic or hazardous

Charges for Analytical Services in Different Categories

Usage Charges

 

 

IIT Bombay Users

IITB-Monash Students

University/ Academic Institute

National Labs/Sine /Research Park IITB (MSME) * Letter from RP Reqd.)

IITB Research Park    (Big Industries) /              Start-up/MSME                (Letter from Research Park/Start-up/MSME required)

Industry

 

 

No GST

+ GST @ 18%

+ GST @ 18%

+ GST @ 18%

+ GST @ 18%

+ GST @ 18%

 

1D or 2D Scan

260

260

520

1300

1950

2600

Per Sample

3D Scan (Mapping per Hour)

520

520

1040

2600

3900

5200

Mapping per Hour

Applications

  • Solar cell finger width and height
  • Thin-film stress calculations
  • Transparent films/photoresist thickness, thin and thickfilm measurements
  • Microlens height/curvature and V-groove depth analyses
  • Roughness studies on machined parts
  • Surface quality and defect review
  • Metal etch uniformity on wafers

Sample Details

Substrate Dimension

Substrate Dimension: Provide solid samples Min- 1 cm x 1 cm, Maximum 10 cm x 10 cm (size either in the form square/ rectangular/circular).

Kindly mark the sample side for the analysis.

Base of the sample should be flat for mounting on the sample holder.

Samples should be in dry form. Sample preparation if any should be done at user end (cutting the sample).

Chemical Allowed: No wet chemicals allowed. No sticky and soft samples allowed.

MSDS (Material Safety Data Sheet) should be given along with samples to ensure that samples should not be toxic or hazardous.

SOP, Lab Policies and Other Details

SOP

Publications