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Category
- Microscopy and Imaging » Force Microscopy
Booking Details
Facility Management Team and Location
022-2159 6746
Prof. Shaibal K. Sarkar
Prof. Rajdip Bandyopadhyaya
Prof. Subhananda Chakrabarti
Prof. Shamik Sen
Prof. Dipti Gupta
Facility Features, Working Principle and Specifications
AFM Modes and Accessories
Routine Modes
- Contact mode AFM
- Tapping mode AFM
Advanced Modes
- STM with following applications:
- Low current STM
- Scanning Tunneling Spectroscopy (STS)
- Fluid Cell AFM
- Magnetic Force Microscopy (MFM)
- Electric Force Microscopy (EFM)
- Conductive AFM (C-AFM)
- Electrochemical AFM and STM
- Nanoindentation and Nanoscratching
* Subject to availability of manpower with relevant expertise.
Available Scanners
- J scanner (125 × 125 × 5 µm)
- E scanner (10 × 10 × 5 µm)
- A scanner (0.4 × 0.4 × 5 µm)
Other Accessories
- Vibration isolation table and acoustic isolation hood
- Optical microscope with color digital video for area selection
- Digital image processing and analysis software
- Quadrexed phase signal processing for higher phase sensitivity and fast scan micro actuator cantilevers
Instructions for Registration, Sample Preparation, User Instructions and Precautionary Measures
We shall accept online registration only through the IRCC webpage. If you need to cancel your slot, send an email immediately to with an explanation.
- Slots will be provided on a first-come-first-served basis.
- USB drives are strictly prohibited for copying data to minimize virus-related issues. You are requested to bring a new blank CD to transfer your data. All data must be transferred within 7 days of imaging. Without exception.
- Users must be present during the entire slot.
Charges for Analytical Services in Different Categories
Applications
AFM Techniques and Applications
Surface Topography and Roughness
Surface topography and roughness characterization involves measuring the texture and irregularities of a surface. Atomic Force Microscopy (AFM) is commonly used for this purpose, providing high-resolution images that reveal surface features at the nanoscale. This analysis is crucial for understanding material properties and behavior in various applications.
Particle Size Analysis
Particle size analysis using AFM helps determine the dimensions and distribution of particles at the nanometer scale. This is important for materials science and engineering, where particle size can significantly influence the properties and performance of materials.
Atomic Resolution Imaging
AFM allows for atomic resolution imaging, enabling the visualization of individual atoms on a surface. This capability is essential for research in nanotechnology and materials science, providing detailed insights into atomic-scale structures and phenomena.
Electrical Mapping
Electrical mapping with AFM involves measuring the electrical properties of a sample surface, such as conductivity and potential distribution. Techniques like Conductive AFM (C-AFM) and Electrostatic Force Microscopy (EFM) are used for this purpose, helping to analyze and optimize electronic materials and devices.
Magnetic Mapping
Magnetic Force Microscopy (MFM) is an AFM technique used to map magnetic properties at the nanoscale. This method is valuable for studying magnetic materials and devices, providing insights into magnetic domain structures and behaviors.
Mechanical Properties
AFM can measure mechanical properties such as hardness, elasticity, and stiffness by probing the sample with a sharp tip. Techniques like nanoindentation and Force Modulation Microscopy (FMM) provide quantitative data on material mechanical behavior.
Sample Details
SOP, Lab Policies and Other Details
Publications
Research Publications
Journal Articles
- “Oriented assembly of Ni-clusters embedded in semi-insulating NiO epitaxial films”, S. K. Yadav, B. P. Sahu, S. Dhar, J. Phys. D: Appl. Phys., 55 (2022) 035002 (7pp).
- “CoFeVSb: A Promising Candidate for Spin Valve and Thermoelectric Applications”, J. Nag, D. Rani, D. Singh, R. Venkatesh, B. Sahni, A. K. Yadav, S. N. Jha, D. Bhattacharyya, P. D. Babu, K. G. Suresh, A. Alam, (Archive) https://arxiv.org/abs/2111.14081.
- “Phosphorus doping of ZnO using spin-on dopant process : A better choice than costly and destructive ion-implantation technique”, M. Mishra, S. Sushama, S. K. Pandey. S Chakrabarti, J. Lumin., vol. 233, no. January, p. 117921, 2021.
- “Fabrication of Through-glass Vias (TGV) based 3D microstructures in Glass Substrate by a lithography-free process for MEMS applications”, V. K. Bajpai, D. Mishra, P. Dixit, Applied Surface Science, vol. 584 (2022), 152494.
- “Growth of Hybrid Perovskite Films via Single‐Source Perovskite Nanoparticle Evaporation”, R. Yadav, M. Roy, G. Banappanavar, M. Aslam, Chem: An Asian Journal 2022. https://doi.org/10.1002/asia.202200087.
- “Ordered stripes to crack patterns in dried particulates of DNA-coated gold colloids via modulating nanoparticle–substrate interactions”, S. Bhattacharjee, S. Srivastava, Soft Matter, 19(12), 2265(2023).
- “Study of residual stress in reactively sputtered epitaxial Si doped GaN films”, M. Monish, S.S. Major, Mater. Sci. Semicond. Process., 150, 106902 (2022).
- “Highly sensitive few–layer MoS2 nanosheets as a stable soil moisture and humidity sensor”, M. S. Siddiqui, A. Mandal, H. Kalita, M. Aslam, Science Direct, Sensors and Actuators B: Chemical, 365, 131930(2022).
- “Highly Stable and Reusable 3D Graphene-Quinizarin Voltammetric pH Sensor”, M. S. Siddiqui, M. Aslam, Journal of the Electrochemical Society, 170, 4 (2023).
- “Investigation of phosphorus-doping of MgZnO thin films using efficient spin-on dopant process”, M. Mishra, R Saha, L. Tyagi, S. Sushama, S.K. panday, S. Chakrabarti, Journal of luminescence, 257, 119748 (2023).
- “Preclinical safety assessment of red emissive gold nanocluster conjugated crumpled MXene nanosheets: a dynamic duo for image-guided photothermal therapy”, B. Singh, R. Bahadur, P. Maske, M. Gandhi, D. Singh, R. Srivastava, Nanoscale, 15, 2932(2023).
- “Study of lithium incorporation in (111) NiO epitaxial layers grown on c-sapphire substrates by pulsed laser deposition technique”, B. P. Sahu, S. K. Yadav, S. Arora, S. Dhar, Journal of Physics D: Applied Physics. (DOI 10.1088/1361-6463/accc41)
- “BiOBr Surface-Functionalized Halide Double-Perovskite Films for Slow Ion Migration and Improved Stability”, Bhawna, M. Roy, A. Kaur, A. Alam, M. Aslam, ACS Appl. Mater. Interfaces, 15, 14, 18473–18481(2023).
Conference Presentations
- S. Bhattacharjee, “Transition from stripe to crack like pattern in dried droplet of colloidal particles” - International Conference on Smart Materials for Sustainable Technology-II (SMST-2022), organized by SIRMB, IIT Bombay, IIT-BHU on 13th -16th October 2022 (Oral).
- S. Bhattacharjee, “Concentric-ring to crack formation in particulates of DNA-AuNP suspension by modulating nanoparticle-substrate interaction” – Complex Fluid Symposium (CompFlu 2022), organized by Indian Society of Rheology (ISR), IIT-KGP on 19th -21st December 2022 (Poster)