Transmission electron microscopy- sample preparation facility - I
Transmission electron microscopy- sample preparation facility - I
Make
GATAN Inc. USA
Model
Model 691
Facility Status
Working
Date of Installation
Facility Management Division
Institute Central Research Facilities (ICRF)

Category

  • Microscopy and Imaging » Electron Microscopy

Booking Details

Booking available for
Internal and External Both

Facility Management Team and Location

Faculty In Charge
Prof. Prita Pant pritapant@iitb.ac.in +91-22-2576-7616
Facility Operator
Ms. Priyanka Kathar priyankakathar@iitb.ac.in extension : 3613 9920610767
Co-convenors
Prof. Prita Pant Prof. MJNV Prasad Prof. Nagamani J. Balila Prof. N Prabhu Prof. Amartya Mukhopadhyay Prof. Sushil Mishra Prof. Sankara Sarma V. Tatiparti Prof. Anil Kottantharayil
Department
MEMS
LAB Email ID
temsampleprep@iitb.ac.in
Facility Location
G 025, Ground Floor, Department of Metallurgical Engineering & Material Science, IIT Bombay, Powai, Mumbai – 400076
Lab Phone No
2221593613

Facility Features, Working Principle and Specifications

Features Working Principle

TEM Sample Preparation

The quality of Transmission Electron Microscopy (TEM) images heavily relies on the preparation of the sample. This process includes: 

  1. Thinning the sample through cutting.

  2. Grinding to achieve the required thickness.

  3. Dimpling the sample surface.

  4. Ion-milling to further reduce thickness and improve transparency to electrons. 

It's crucial to ensure that these steps do not alter the intrinsic properties of the material being studied.

Body Specification
  1. Variable Low Speed Diamond Saw
    Materials (ceramics and metals) can be reduced to 0.5mm in thickness using this technique, which uses a diamond blade, with the wheel speed varying between 100 to 400 rpm.

  2. Tuned Piezo Cutting Tool
    This is used for cutting the material (both ceramic and metal) in the desired size and shape, so that it can be placed inside the TEM sample holder 
    Ratings and Specifications
    Disc Cutter External PSU (Power Supply Unit)
    Input Voltage: 100-240 VAC (~)
    Output Voltage: 24VDC
    Output Power: 30W
    Frequency: 47-63 Hz
    Mains supply voltage fluctuations are not to exceed 10% of the nominal supply voltage
    Disc Cutter Power Jack ("DC in")
    DC Input Voltage: 24 VDC
    DC Input Current: 1.25 A
    Stereo Microscope Power Jack ("DC Out")
    Used to power optional microscope
    Output Voltage: 24 VDC 
    Output Current: 0.4A
    Environmental Conditions
    Non-operating relative humidity (non-condensing): 10-90%
    Storage temperature range: 0-65°C
    Operating Humidity Range: 20-80%
    Operating maximum thermal gradient: 15°C/hr
    Operating temperature range: 16-24°C
    (Information partly obtained from GATAN Manual)

  3. Disc Punch
    Used only for metallic sheets. The Disc punch prepares specimen discs of 3 mm in diameter and material thicknesses ranging from 10 µm to above 100 µm.

  4. Specimen Mounting Hot Plate
    This is used for firmly attaching specimen discs to stubs during grinding. This is done by using a low melting point wax polymer, heated on the hot plate, to form a strong, thin, hard adhesive bond. Operating temperature range is up to 130°C.

  5. Disc Grinder
    This is used for holding the stub with the specimen attached for grinding down to a certain thickness. The GATAN Model 623 Disc Grinder possesses superior resolution and preloading of the specimen drive screw to result in excellent control of specimen thickness. By using the weight of the grinder it limits the maximum polishing pressure the operator is able to reduce specimen damage to a minimum. The samples are polished using different grit silicon carbide papers such as 40 µm, 15 µm, and 5 µm, in sequence.(Information partly obtained from GATAN Manual)

  6. Dimple Grinder
    After manual grinding, using a disc grinder, precision thinning near the central region of the 3 mm disc specimen (or forming a dimple) is performed using a dimple grinder.
    Specifications:
    External PSU Input Voltage: 100-240 VAC (~)
    Output Voltage: 24 VDC
    Output Power: 30W
    Frequency: 47-63 Hz
    Power Jack ("DC in")
    DC Input Voltage: 24 VDC
    DC Input Current: 1.25A
    Stereo Microscope Power Jack ("DC out")
    Output Voltage: 24 VDC
    Output Current: 0.4A
    Environmental Conditions
    Non-operating relative humidity: 10-90%
    Storage temperature range: 0-65°C
    Operating humidity range: 20-80%
    Operating maximum thermal gradient: 15°C/hr
    Operating temperature range: 16-24°C

  7. Precision Ion Polishing System (PIPS)   
    After dimple grinding, the final stage of precision polishing (thinning) of the 'dimpled' region up to electron transparency is done with the PIPS. 
    Specifications:    
    Input Voltage: 100/120/240V
    Input Current: 3/3/1.5A
    Frequency: 50/60Hz
    Output Voltage: 120VAC 50/60Hz
    Output Current: 3.0 A Max.
    Non-operating relative humidity (non-condensing): 10-90%
    Storage temperature range: 0-65°C
    Operating humidity range: 20-80%
    Operating maximum thermal gradient: 15°C/hr
    Operating temperature range: 5-35°C
    For indoor use only
    (Information partly obtained from GATAN Manual)

Instructions for Registration, Sample Preparation, User Instructions, Precautionary Measures and Charges

Instructions for Registration

TEM Sample Preparation Guidelines

  1.  Maximum of two samples per slot, scheduled either in the forenoon or afternoon on any working day. Note that preparation time may exceed slot duration.

  2. Sample dimensions must be adequate for TEM preparation processes.

  3. The user must be present and available during the entire TEM sample preparation process.

User Instructions and Precautionary Measures

We shall accept online registration only through the IRCC webpage. If you need to cancel your slot, send an email immediately to with an explanation.
Slots will be provided on a first-come-first-served basis.
Users must be present during the entire slot.

Applications

TEM Sample Preparation Facility
The Transmission Electron Microscopy (TEM) sample preparation facility specializes in creating thin samples that are electron-transparent for TEM analysis. Equipped with advanced tools and techniques, the facility can produce both planar and cross-sectional samples across a wide range of material types.
Methods employed include focused ion beam (FIB) milling, mechanical polishing, and other precise techniques to ensure the samples meet the stringent requirements for TEM analysis.
This capability is crucial for research in materials science, nanotechnology, and other fields where high-resolution imaging of material structures at the atomic level is essential.

Sample Details

SOP, Lab Policies and Other Details

Publications

Publications
none