Brukar Alicona Micro CMM
Request form for external booking (Sample and analysis details)
Make
Bruker Alicona
Model
Brukar Alicona Mirco CMM
Facility Status
Working
Facility Management Division
Centre for Sophisticated Instruments and Facilities (CSIF)

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Category

  • Microscopy and Imaging » Optical Microscopy

Booking Details

Booking available for
Internal and External Both

Facility Management Team and Location

Facility In Charge
Ramesh Singh
Facility Operator
Arun Nair
Facility Management Members
Prof Ramesh Singh
Prof Soham Mujumdar
Prof Rakesh Mote
Prof Indradev Samajdar
Department
Mechanical
Lab Email ID
mtl.iitb@gmail.com
Facility Location
MTL lab, S3 bay, IIT Bombay, Powai, Mumbai 400076
Lab Phone No
022-2572 3749

Facility Features, Working Principle and Specifications

Facility Description

Facility Description

Non-contact 3D profiling and imaging device
Form and roughness measurement
Measure step height ranging from nm to mm
True Color 3D Imaging

Features Working Principle

Focus variation microscopy (FVM) is a 3D imaging technique that captures high-resolution surface topography by analyzing changes in focus as the microscope moves through different focal planes. It works by focusing at various depths on the sample and capturing images at each plane. The sharpness of each image varies with the surface height, allowing the system to reconstruct a detailed 3D model of the surface. FVM is a non-contact, high-precision method used for measuring surface roughness, step heights, and other surface features without damaging the sample.

Body Specification

Number of measurement points - single measurement: X: 1720, Y: 1720, X x Y: 2.95 Mio. multi measurement: up to 500 Mio.

Positioning volume (X x Y x Z) - 310 mm x 310 mm x 310 mm = 29 791 000 mm³

Travel speed of axes - up to 100 mm/s

Coaxial illumination - LED coaxial illumination (color), high-power, electronically controllable

3D Accuracy 10360-8 - EUni:Tr:ODS,MPE = (0.8 + L/600) μm (L in mm) Axis accuracy based on ISO 10360-8. EUniZ:St:ODS,MPE = (0.15 + L/50) μm (L in mm) Valid for single measurements, height step measurements.


 

Instructions for Registration, Sample Preparation, User Instructions and Precautionary Measures

Instruction for Sample Preparation

Samples not allowed - Fluid, Transparent and Highly reflective.

Fixture - Need to get one's own fixture if you have an intricate sample.

Step Height - Step height if any must be less than 2mm.

Sample Size - Max (150mm x 150mm x 100mm)

Sample Weight - less than 10kg

Charges for Analytical Services in Different Categories

Usage Charges

Facility Name

Internal (IITB)

External (Academic)*

Industry/Others*

 

Alicona Micro CMM

 

 

Rs. 500/scan

 

Rs. 1000/scan

 

Rs. 2000/scan

Applications

Surface Quality Inspection 

Dimensional Measurement 

3D Profile Measurement 

Tolerancing and Geometric 

Dimensioning Tool Wear 

Monitoring Optical Metrology

Sample Details

SOP, Lab Policies and Other Details

Publications