Category
- Material Characterization » Mechanical Characterisation
Booking Details
Facility Management Team and Location
Facility Features, Working Principle and Specifications
Features :
- Load Control and Displacement Control capabilities.
- The same tip used for indentation is also used for scanning the sample.
- Can be used for testing thin films and small structures.
Technical specifications :
I) Load Range : Low load - upto 9.5 mN, High load - upto 500 m
II) Displacement Range:
a) Low load: Maximum Indentation displacement (Z)- 5µm, Maximum lateral displacement - 16µm
b) High load: Max indentation displacement- 80µm
III) Low Load Resolution : Indentation 75nN, Lateral axis 3µN
IV) Displacement resolution : Indentation axis up to 0.04nm, Lateral axis up to 4nm
V) Heating/Cooling stage : Temperature range 25oC to 600oC
VI) nano- DMA (Dynamic Mechanical Analysis):
Range:
a) Frequency range: 1Hz to 300Hz (Below 10Hz, the test can take a very long time)
b) Load range : Maximum force-10000µN(10 mN)
Instructions for Registration, Sample Preparation, User Instructions, Precautionary Measures and Charges
- Only one registration will be accepted at a time.
- User has to be present when the slot has been allotted while testing the samples.
- Users please note that if your samples are not ready at the time assigned to you for Nanoindentation then you will lose your slot and cannot apply for another slot for one week. You must inform us at least 24 hours in advance if for some unavoidable reason samples will not be ready for Nanoindentation at the time assigned to you - in tha+t case we will reassign a slot and no penalty will be imposed.
- Sample roughness has to be less than 200nm.
- Loose particles or thin films with porous coatings will not be entertained.
- Powder samples will not be done. If pellet can be prepared of the powder by sintering then it can be done.
- Liquid samples cannot be done.
- Optical microscope available in the machine for optically locating the sample is 10x and 50x.
Instructions for users:
- Preliminary literature survey has to be done for the respective experiment and the user must be aware of the parameters to be used for his samples. If the sample is unknown, then the parameters can be optimized by us.
- Absence for the slot without prior information to the Nanoindentor lab will lead to debar of the student from another registration for 15days. Twenty minutes past the time of slot allotted will be treated as cancelled.
- User should not apply for the slot if the sample is not ready.
- Roughness value is mandatory and should be reported before the slot is allotted.
- The user must have optical image/SEM image of the sample who are interested to do experiment on the specific location.
- The slot timing is divided into morning slot from 9:30am to 1:30pm and afternoon slot will be from 2pm to 6pm. If your samples are not completed in this time slot, then you have to apply for a fresh slot and book another slot. Time will not be extended for any user. Depending on the load function and the type of tests the timings will be scheduled.
- Data will be given only in CDs or DVDs. It has to be brought by the user. Data collection time is from 9:30am to 9:45am and from 5:30pm to 5:45pm in weekdays.
- Sample stubs should be returned to the lab immediately. If not returned, the data will not be provided to the users.
- The user should be present at the time of the slot.
- You can request for two consecutive slots only once in a week. If your experiments need more time then please drop a mail to nanoindenter@iitb.ac.in and cc to jayabalila@iitb.ac.in . We can accordingly allot you a slot.
- Slots will be provided as per the queue.
- For cantilever bending experiments and resistance measurement experiments one full day slot will be given. For High temperature tests, the slot will be allotted for two consecutive days to each user.
- For High temperature tests, the user has to inform one week earlier so that the slot can be scheduled for two consecutive days. The set up and the calibration may take more than half a day. The slots for temperature tests may take time as it will run only once a month.
- Scanning of the sample/SPM imaging of indents takes time. Slower scanning rates may consume maximum an hour. Therefore, in the time slot whatever images possible to scan will be given.
- For scratch tests or some specific tests, if the desired tip is unavailable with us the user can get their own tip which can be fixed in our transducer.
- Beyond 100 indents for high temperature testing, the user has to arrange for their own high temperature tip.
- Beyond 50 scans for scratch + imaging condition, the user has to bring their own tips.
For TA’s and Independent users for usage of the machine after official hours and non-working days:
i) Off-hour users can do measurements only on their own samples. For other users, a separate requisition form needs to be submitted even if off-hour time is to be allotted.
ii) We will ban the users who are caught doing some other samples and the person whose sample they are doing for the entire year.
iii) One week prior you have to inform about your experiments and the materials needed for your experiment is mandatory. Your requisition has to be there one week before on the basis of which a slot will be allotted to you on off-hour which you can do on your own.
Applications
Bulk materials Multiphase materials MEMS devices-cantilever bending experiments to measure the stiffness, electrical experiments for cantilever bending experiments. Micropillar Experiments Nanostructured materials Scratch tests: A) Protective coatings B) Depth profiling of layered materials Biological materials Bone/Hair samples with proper sample preparation and polishing. Powder samples: Loose particles/powders cannot be done. Powder samples can only be done if pellet is made of the powder using a binder followed by sintering. (Dimensions of pellet- diameter of 10mm and height not more than 5mm). After the application of the load by the indenter, the pellet should not release the particles. Such samples would not be done as it can damage the indenter. Proper polishing of the pellet mounted sample has to be done.
Sample Details
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For high temperature indentation, an inert atmosphere is needed to avoid the oxidation of the tip as well as the samples.
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Any type of loose/dust particles is not allow to avoid the contamination will tip.
No need to any precursor for the experiment.