Renishaw inVia Reflex Raman System

External users: registration to be carried out only through I-STEM portal
Additional information about sample and analysis details should be filled in the pdf form provided in the I-STEM portal under “DOWNLOAD CSRF”

Internal users (IITB): registration to be carried out only through DRONA portal
Additional information about sample and analysis details should be filled in the pdf form provided here.

Make
Renishaw, UK
Model
inVia Reflex
Facility Status
Working
Date of Installation
Facility Management Division
Centre for Sophisticated Instruments and Facilities (CSIF)

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Category

  • Spectroscopy and Spectrometry » Raman Spectrometer

Booking Details

Booking available for
Internal and External Both

Facility Management Team and Location

Facility In Charge
Prof. Anil Kottantharayil
Email: anilkg@ee.iitb.ac.in
Contact: 022-2576-7438
Facility Manager
Dr. Gajender Saini
Email: gsaini@iitb.ac.in
Facility Operator
Omkar Phondke
Email: 30005318@iitb.ac.in
Facility Management Members
Prof. Dipanshu Bansal
Prof. Anshuman Kumar
Prof. Swatantra Pratap Singh
Department
Centre for Research in Nanotechnology and Science (CRNTS)
Lab Email ID
lris@iitb.ac.in
Facility Location
208, 1st Floor, SAIF/CSIF
Lab Phone No
022-2159-6899

Facility Features, Working Principle and Specifications

Features Working Principle

Working Principle:

Light reflected of Raman-active samples irradiated with monochromatic radiation consists of a Raman component having slightly different wavelength as compared to that of the incident radiation. A spectrometer and detector are used to measure intensity of reflected light and it's corresponding wavelength to give us Raman spectrum for the sample. 

Features:

Following measurements can be performed using Raman/PL signal-

  • Spectral Analysis
  • Mapping
  • Depth Profiling

Aforementioned measurements can also be performed-

  • While varying temperature (Temperature-dependent Analysis)
  • While varying degree of polarization / orientation of sample (Polarization-dependent Analysis)
  • At specific intervals of time (Time-dependent Analysis)
Body Specification

Specifications:

Spectral Range of System

  • Raman - 75 to 4000 cm-1
  • PL - 330 to 1600 nm

Motorized Stage

  • Maximum travel distance of 110 mm x 75 mm x 25 mm with minimum step size of 50 nm x 50 nm x 10 nm.
  • Minimum step-size for mapping is 100 nm.

Range for Temperature-dependent Analysis

  • 300K to 12K (using CCR)
  • 300K to 1200K (using furnace) 

Polarization-dependent Analysis

  • Incident light can be polarized as normal, orthogonal or circular.
  • Reflected light can be polarized at any angle.

Additional measurements

  • Low-wavenumber analysis from 15 cm-1 using LWN filter.
  • Fiber-optic probe for analysis of samples which cannot be directly placed on the microscope stage.

Sample Preparation, User Instructions and Precautionary Measures

Instruction for Sample Preparation

• Maximum size of sample which can be placed on the microscope stage is 50 mm x 50 mm x 30 mm.

• For temperature-dependent studies sample size should be less than 3 mm x 3 mm x 3 mm.

• If possible, use of coolants/lubricants should be avoided when resizing the samples.

User Instructions and Precautionary Measures

• Sample should remain stable upon exposure to high intensity laser beam.

• For low-temperature analysis, sample must be able to withstand high vacuum conditions.

• For high-temperature analysis, sample should not deform or emit fumes as temperature is increased.

• System’s optical microscope may not be able to acquire data from particles/structures having size less than 100 nanometers.

 

 

 

Charges for Analytical Services in Different Categories

Usage Charges
 IIT-B / MonashAcademic InstitutesNational Labs / SINE / Research Park (MSME)Research Park (Big Industry partners) / MSME not associated with Research ParkIndustries 
Spectral Analysis - A20040080010001200per sample
Spectral Analysis - B400800160020002400per sample
Spectral Analysis - C6001200240030003600per sample
Spectral Analysis - D6001200240030003600per sample
PL Mapping6001200240030003600per sample
Raman Mapping12002400480060007200per sample
High-Temperature8001600320040004800per sample
Low-Temperature30006000120001500018000per sample
Polarization-Dependent6001200240030003600per sample
 
Spectral Analysis - AUniform samples. Data is to be acquired at any two locations.
Spectral Analysis - BNon-uniform samples. Data is to be acquired at upto five different locations.
Spectral Analysis - CAnything other than Spectral Analysis - A or Spectral Analysis - B.
Spectral Analysis - DRequirement of UV laser / In-situ experiments.
 

Charges are excluding 18% GST (wherever applicable). 

Charges are for estimation purpose only. 

Charges are for analysis using one particular excitation laser wavelength.

Applications

  • Pharmaceuticals and Cosmetics

  • Geology and Mineralogy

  • Carbon Materials

  • Semiconductors

  • Life Sciences

  • Polymer science

Sample Details

Chemical allowed

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Gases allowed

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Substrate Dimension

--

Target dimension

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Contamination remarks

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Precursors/ Targets allowed

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SOP, Lab Policies and Other Details

Publications

• Mireja S, Khakhar DV. High β-phase PVDF films formed by uniaxial
compression. Polymer. 2024 Feb 2;293:126665
• Joshi DJ, Jha S, Malek NI, Park TJ, Kailasa SK. Rational design of niobium
carbide MXene quantum dots decorated with arginine for the fluorescence
sensing of superoxide anion in Saccharomyces cerevisiae cells. Sensors and
Actuators B: Chemical. 2024 Apr 1;404:135226
• Patra U, Mujeeb F, Dhar S. Vapor–Liquid–Solid-Mediated Layer-by-Layer
Growth of Stepped-Wedge-Shaped WS2 Microribbons Using the Chemical Vapor
Deposition Technique. Crystal Growth & Design. 2024 Feb 5
• Mandal KK, Singh AK, Kumar B, Shah AP, Vij R, Majumder A, Khunte JJ,
Achanta VG, Kumar A. Emission engineering in monolithically integrated silicon
nitride microring resonators. arXiv preprint arXiv:2401.04963. 2024 Jan 10