Category
- Microscopy and Imaging ยป X-ray Microscopy
Booking Details
Facility Management Team and Location
Facility Features, Working Principle and Specifications
Working Principle
Imaging consists of directing X-rays at an object from multiple orientations and measuring the decrease in intensity along a series of linear paths. This decrease is characterized by Beer's Law, which describes intensity reduction as a function of X-ray energy, path length, and material linear attenuation coefficient. A specialized algorithm is then used to reconstruct the distribution of X-ray attenuation in the volume being imaged.
The gray levels in a slice image correspond to X-ray attenuation, which reflects the proportion of X-rays scattered or absorbed as they pass through each voxel. X-ray attenuation is primarily a function of X-ray energy and the density and composition of the material being imaged.
Unprecedented resolution in non-destructive 3D X-ray imaging
- True spatial resolution <700 nm Below 70 nm minimum achievable voxel
- Two-stage magnification that provides Resolution at a Distance (RaaD), delivering large, flexible working distances while maintaining submicron resolution
- Non-destructive interior tomography uniquely enabled by Scout-and-Zoom
Advanced contrast capabilities for imaging challenging samples
- Enhanced absorption contrast detectors maximize collection of contrast-forming low energy X-ray photons that are critical to imaging numerous material types
- Tunable propagation phase contrast to visualize low Z materials and biological samples that tend to have limited absorption contrast
- Maximum discernibility with dual energy probing of features normally indistinguishable within a single scan
The premier in situ and 4D solution
- Nondestructive X-ray microscopes uniquely characterize the microstructure of materials in simulated conditions-in situ-as well as the evolution of properties over time (4D)
- Supporting a wide variety of in situ rigs for submicron imaging of samples up to inches in size within environmental chambers and under varying conditions
- RaaD enables Xradia Versa to maintain high resolution as the space between the X-ray source and sample grows whereas the resolution of conventional micro-CT architecture degrades when samples are placed within spacious in situ chambers
Instructions for Registration, Sample Preparation, User Instructions, Precautionary Measures and Charges
Users should fill up the FDXM form and provide specific details about the specimen
Sample should be stable, that is it should not experience drift, while being imaged, as it may collide with the moving parts.
Max sample size permitted is 3cm * 3cm * 3cm.
For better results, sample should be much smaller than the maximum sample size.
We shall accept online registration only through the IRCC webpage. If you need to cancel your slot, send an email immediately to with an explanation.
- Slots will be provided on a first-come-first-served basis.
- USB drives are strictly prohibited for copying data to minimize virus-related issues. You are requested to bring a new blank CD to transfer your data. All data must be transferred within 7 days of imaging. Without exception.
- Users must be present during the entire slot.
Applications
Materials Research
- Characterize materials, observe fracture mechanics, investigate properties at multiple length scales.
- Quantify and characterize microstructural evolution.
- Perform in situ and 4D (time dependent) studies to understand the impact of:
- Heating, cooling
- Oxidation, wetting
- Tension, tensile compression
- Imbibition, drainage
- Other simulated environmental studies.
- Xradia 520 Versa offers:
- Non-destructive views into deeply buried micro-structures.
- Compositional contrast for studying low Z or "near Z" elements and difficult-to-discern materials.
Natural Resources
- Characterize and quantify pore structures, measure fluid flow.
- Study carbon sequestration processes, analyze tailings to maximize mining efforts.
- Xradia 520 Versa offers:
- Most accurate 3D submicron support for digital rock simulations.
- In situ multiphase fluid flow studies and 3D mineralogy.
Life Sciences
- Perform virtual histologies, visualize cellular and subcellular features.
- Characterize submicron structures in samples ranging from inches to centimeters.
- High resolution, high contrast images of cellular and subcellular structures.
- Xradia 520 Versa offers:
- Highest resolution and best contrast in lab-based computed tomography solutions.
- For unstained and stained hard and soft tissues, and biological microstructure.
Electronics
- Optimize processes, determine package reliability.
- Perform failure analysis, analyze package construction.
- Xradia 520 Versa offers:
- Non-destructive submicron imaging of intact packages.
- Defect re-localization and characterization with fast results.
- Industry's highest resolution, non-destructive solution for 3D submicron imaging.