Category
- Microscopy and Imaging » Electron Microscopy
Booking Details
Facility Management Team and Location
Facility Features, Working Principle and Specifications
Working Principle: The 200 kV Field Emission Gun-Transmission Electron Microscope (FEG-TEM) has the ability to form images that provide detailed information about the materials and can reveal the atomic arrangements up to a point resolution of 0.19 nm at localized regions. It also gives information about specimen crystallinity and its orientations through diffraction patterns. This electron microscope is also equipped with an electrode short switch, allowing for operation at 120 kV for observation and imaging of beam-sensitive specimens like biological, polymers etc.
Features:
- EM-20014 ultrahigh resolution
- Point resolution : 0.19 nm
- Lattice resolution : 0.1 nm
- Magnification : 50 x to 1,500,000 x
- Acc. voltage : 120 kV, 200 kV
- Electron gun emitter : ZrO/W(100)
- Brightness : ≥4x108 A/(cm2.sr)
- Pressure: On the order of 10-8 Pa
- Probe current : >=0.5 nA for 1 nm probe
Instructions for Registration, Sample Preparation, User Instructions, Precautionary Measures and Charges
- New users are requested to contact the FEG TEM 200kV lab before registration.
- Registration is online (for internal users) through the Drona interface.
- An appointment will be given as per queue and will be informed by email.
- Cancellation/postponing a slot at least 24 hrs earlier.
- The user has to collect TEM grids from the FEG TEM lab.
- The user has to come for TEM analysis with a prepared sample on the TEM grid.
- The samples should be prepared on TEM grids of 3mm size and sample thickness should be less than 100 nm for high-resolution images.
- Any query related to your FEG-TEM analysis can be emailed to fegtemlab@iitb.ac.in.
- The samples should be dry and should withstand ultra-high vacuum.
We prefer you or your representative who knows and understands the sample should be present on the day of appointment.
Sample preparation if any should be done at the user end only.
The samples should be dry and should withstand ultra-high vacuum.
For registration related information :http://www.saif.iitb.ac.in/Docs/External%20User%20Request%20Registration%20Process.pdf
Applications
- Nano science/Nano Technology
- Micro/Nano electronics
- Thin Films
- Catalysis
- Corrosion
- Polymer Science
- Energy Science/Engg.
- Biological and life sciences
Sample Details
N.A.
Sample thickness should be less than 100 nm for HR imaging
If samples are not dried, column vacuum gets contaminated