EC-STM
Make
Bruker India Scientific Private Limited
Model
Multimode 8
Facility Status
Not Working
Date of Installation
Facility Management Division
Centre for Sophisticated Instruments and Facilities (CSIF)-IoE Funded

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Category

  • Microscopy and Imaging » Force Microscopy

Booking Details

Booking available for
Internal and External Both
Available Equipment/ Mode of use
AFM mode currently

Facility Management Team and Location

Facility In Charge
Prof. Manoj Neergat
Co-convenors
Prof. Balasubramaniam Kavaipatti
Facility Operator
None assigned. Will be run with students trained on the facility, initially.
Facility Management Members
Prof. Manoj Neergat
Prof, Sankara Sarma Tatiparti
Prof. Aswani Yella
Prof. Dinesh Kabra
Prof. C. Subramanian
Prof. Arindam Sarkar
Prof. Balasubramaniam Kavaipatti
Department
DESE
Lab Email ID
bala.ramanathan@iitb.ac.in
Facility Location
EN 609, 6th Floor, DESE
Lab Phone No
3808

Facility Features, Working Principle and Specifications

Facility Description

Facility Description

Electrochemical STM (EC-STM)- Can perform Scanning Tunneling Microscopy (STM). It also includes potentiostat/galvanostat hardware to perform EC-STM experiments. Lateral/frictional force microscopy, conductive AFM, magnetic and electric force microscopy, and Kelvin Probe Microscopy can be done. Experiments can be conducted in contact/non-contact/tapping mode in air or any other fluid.

Features Working Principle

The system is equipped to achieve high resolution in imaging in air or any other fluid either by tuning the cantilever resonance frequency by photo thermal (not piezo) or by imaging at off resonance frequency by driving the z scanner sinusoidally without the need to tune the cantilever.

Body Specification

Modes: Contact/Non-contact/Tapping

Media: Air or any other fluid

Instructions for Registration, Sample Preparation, User Instructions and Precautionary Measures

Instruction for Sample Preparation

Samples for AFM imaging should be immobilized on a rigid substrate. Macroscopic samples (such as certain biomaterials, crystals, polymer membranes, etc.) can be attached directly to a stainless steel sample disk with an adhesive. Dissolved or suspended samples like cells, proteins, and DNA are usually bound to a flat substrate like mica or glass. Most scanning probe systems are able use the following substrates:

  • Microscope slides
  • Cover slips
  • Mica discs and sheets
  • Petri dishes
User Instructions and Precautionary Measures
  1. The MultiMode and Innova (both scanning sample SPMs) cannot hold microscope slides or petri dishes.
  2. When imaging fluid samples, use extraordinary precautions against spillage. Fluids must not be spilled on or around components containing electronic parts.
  3. Avoid spilling all corrosive fluids on exposed surfaces; otherwise, damage may result. In the case of a spill, immediately clean and dry all affected surfaces carefully.
  4. Do not stare at the laser beam either directly or from a highly reflective surface
  5. Do not use acetone or other unauthorized cleaners/solvents to clean the MultiMode 8.
  6. Do not change samples in the middle of operation. Verify that the stage is clear of tools, objects, and debris at all times. Use alcohol wipes periodically to keep the stage clean of dust. Dispose of wipes in an appropriately labelled solvent-contaminated waste container

Charges for Analytical Services in Different Categories

Usage Charges

• Charges mentioned are per sample

MediumDescriptionIITB Internal UsersExternal 
(Academic/ National R&D Labs)
External (Industry)
AirSTM₹ 1000 ₹ 5000 + 18% GST₹ 8000 + 18% GST
FluidSTM₹ 3000₹ 7500 + 18% GST₹ 12000 + 18% GST

Electrochemical

STM

₹ 4500₹ 10000 + 18% GST₹ 20000 + 18% GST

Applications

  1. Scanning Tunneling Microscopy (STM)
  2. Electrochemical STM (EC-STM)
  3. Lateral/frictional force microscopy
  4. Conductive AFM
  5. Magnetic and Electric Force Microscopy
  6. Kelvin Probe Microscopy 
  7. Scanning Capacitance Microscopy
  8. Tunneling Atomic Force Microscopy
  9. Scanning Spreading Resistance Microscopy
  10. Conductive Atomic Force Microscopy

Sample Details

SOP, Lab Policies and Other Details

Publications